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Product

Nexensor is oriented to the future with a perfect measuring technology.

XI-M12
Surface Profilometer

We can manufacture ultra-high-speed large-area optical systems as well as microscopic optical systems,
according to customer specifications, that can measure monolayer membrane shapes and
3D surface shapes of products with fine or narrow depth like u-bumps or fine patterns.

You can drag from side to side.
Specification
FOV 12mm X 12mm Can manufacture large-area and microscopic structures
Repeatable < 0.1 um For standard specimens
Measuring speed < 0.5 sec For 100um height
Inspection item Measurement of monolayer membrane thickness and shapes, and measurement of surface shapes such as warpage, height, and so on
XF-1000
Free Form Metrology

It is possible to inspect the real-time 3D shapes of hard-material products with free curves.
It is possible to inspect the warpage of semiconductors, the nanometer-level dent of membrane products, and the 3D appearance of glass products.

You can drag from side to side.
Specification
Equipment size 800mm X 800mm X 1500mm WDH
Inspection time < 0.5 sec
FOV 100mm X 100mm Changeable
Power AC 220V
Inspection item 3D Warpage, Dent Glass, Free curve